ATS 2012 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.

Major topics include, but are not limited to:

Automatic Test Pattern Generation (ATPG)
Analog Test / Mixed-Signal Test
Boundary Scan Test
Board and System Test
Built-In Self-Test
Design for Testability (DFT)
Design Verification and Validation
Defect-Based Testing
Delay and Performance Test
Diagnosis and Debug
Dependable System
Economics of Test

Fault Modeling and Simulation
Fault Tolerance
High-Speed I/O Test / RF Testing
Memory Test / FPGA Test
On-Line Test
System-on-a-Chip Test
System-in-package (SiP)/ 3D Test
Software Testing / Software Design for Testing
Test Compression
Temperature/Power-aware Test
Test Quality
Yield Analysis and Enhancement

Submissions

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Regular Session: The ATS’12 Program Committee invites original, unpublished paper submissions for ATS’12. Paper submissions should be complete manuscripts, up to six pages (including figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. An abstract of 50 words or less and 5 10 keywords are also required All submissions are to be made electronically . through the ATS’12 website. Detailed instructions for submissions are to be found at the ATS’12 website. Electronic submissions in PDF files are strongly recommended. A submission will be considered as evidence that, upon acceptance, the author(s) will submit a final camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. The registration of at least one author is required for publication.

Industry Session: This session will address a wide range of practical problems in LSI test, board and system test, diagnosis, failure analysis, design verification, and so on. The session will consist of poster presentations and optional oral presentations. A one-page abstract is required for submission. Each submission should also include the complete address and designate a contact person and a presenter. Abstract submissions should be emailed to Industry Chair.

Key Dates

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Regular Session
Submission deadline: May 25, 2012
Notification of acceptance: August 5, 2012
Final copy deadline: August 31, 2012

Industry Session
Submission deadline: July 5, 2012
Notification of acceptance: August 5, 2012
Final copy deadline: August 31, 2012

Additional Information

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General Information
General Chair: Kazumi Hatayama

Submission Related Information
Program Chair: Hiroshi Takahashi

Committees

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General Chair
K. Hatayama: NAIST

General-Vice Chair
T. Inoue: Hiroshima City U

Program Chair
H. Takahashi: Ehime U

Program-Vice Chair
S. Ohtake: Oita U

Finance Chair
H. Yotsuyanagi: U Tokushima

Local Arrangement Chair
H. Yokoyama: Akita U

Registration Chair
T. Yoneda: NAIST

Publicity Chair
K. Miyase: Kyutech

Publications Chair
M. Arai: Tokyo Metropolitan U

Industry Chair
S. Hamada: Fujitsu Semiconductor
S. Komatsu: U Tokyo

Tutorial Chair
Y. Miura: Tokyo Metropolitan U

Audio Visual Chair
K. Yamazaki: Meiji U

Secretary
H. Ichihara: Hiroshima City U

North American Liaison
N Nicolici: McMaster U

European Liaison
I. Polian: U Passau

Ex Officio
S. Kajihara: Kyutech

For more information, visit us on the web at: http://aries3a.cse.kyutech.ac.jp/~ats12/

The 21st IEEE Asian Test Symposium (ATS 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).